Thickness Analysis Tool← Swiss Terahertz · Outils
Drop a spectrometer export here — either the cluster file with the sample scan and the held reference in it, or two plain column exports dropped together, one the reference and one the sample. Everything runs in your browser as you go; nothing is sent anywhere.
thick

Time domain

reference vs sample · picoseconds

Refractive index

n vs frequency

Absorption

power coefficient · cm⁻¹

Real permittivity

ε′ vs frequency
ready

How thickness is measured. A sample thick enough to separate its first internal reflection from the main pulse gives two independent timings — the transmitted delay (n−1)d/c and the echo delay 2nd/c. Two equations, two unknowns: thickness and refractive index come out together, with no assumed index and no calibration against a reference sample. Below that, the echo hides inside the main pulse and the two stay correlated; the tool says so and falls back to the full Fabry–Pérot fit, where (n−1)·d is still exact to a few parts per thousand and a measured thickness pins down the rest. Absorption depends on amplitude rather than timing, so beam coupling, alignment and a stale reference all degrade it — where a figure is marked upper bound, it is not a measurement. Atmospheric water-vapour lines are flagged and excluded from every fit. Validate against a known standard before quoting absolute numbers.

analysing…